Hear our technical experts as they present these topics:

Wednesday, March 9
Title: “Optical Fiber Communication, a key enabler for O-RAN”
Time: 11:45 a.m. - 12:15 p.m.
Location: Theater 2
Description: This presentation focuses on the transport network architecture in O-RAN that aims to highlight optical networking requirements including performance. It further explores Front-Haul, Mid-Haul & Back-Haul transport aspects along with the requirements for the Front-Haul on latency, synchronization, range and mesh architectures.
Presenter: Sundara Venkatesh “Venky”
Title: Market Development Manager, Anritsu
Bio: Venky spent 20+ years in the wireless, transport and wireline industry working with multiple global operators, and network infrastructure vendors. At Anritsu, he is responsible for the strategic direction of the Anritsu portfolio within NEMS, ORAN and Private Networks. His broad knowledge base spans across different wireless, transport & wireline technologies including Cellular, Bluetooth, WiFi, and NFC. He holds a Master’s from Arizona State University.

Title: “400Gbps Post FEC BER and Jitter Tolerance Test”
Time: 4:15 p.m. – 4:45 p.m.
Location: Theater 2
Description: High-speed and large-capacity transmission standards using PAM4 signaling, such as 400 GbE, stipulate the use of Forward Error Correction (FEC) to assure transmission quality. Consequently, jitter tolerance tests for SERDES, DSP, and CDR used by transceivers are required at both pre-FEC evaluation of bit error rate performance as well as at correctable/uncorrectable FEC symbol error performance.
Presenter: Hiroshi Goto “G2”
Bio: Hiroshi Goto has over 25 years of experience as a high speed and optical Engineer at Anritsu Company holding a variety of positions including Design Engineer, Product Marketing Engineer and currently high speed and optical Product Manager and Business Development Manager. Mr. Goto holds a Bachelor’s degree in Physics from Aoyama Gakuin University. He resides in the Dallas area and has authored numerous industry application notes and white papers and frequently speaks on the topic of signal integrity.

Thursday, March 10
Title: “Next generation Opto-electronic devices- Measurement Challenges”
Time: 2:45 p.m. – 3:15 p.m.
Location: Theater 2
Description: Opto-electronic devices provide almost unlimited bandwidth, low loss, low interference, short- and long-distance coverage, and high-speed data transmission capability to bandwidth-hungry data transmissions and high-speed interconnects. This presentation will focus on various advancements in the Opto-electronic devices, market trends, and focus on measurement challenges associated with testing and verifying the performance of the devices.
Presenter: Navneet Kataria
Title: Product Marketing Manager, Anritsu
Bio: Navneet Kataria is the Product Marketing Manager for Anritsu benchtop Vector Network analyzer product line namely VectorStar™ and Shockline VNA at Anritsu Company. He has over 11 years of experience working in the field of Test and Measurement in various technical and business roles. Navneet earned his Bachelor’s degree (Hons.) with a specialization in Electronics and Communication from India.

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