Visit Our Technical Experts and see the Latest Innovations in Millimeter-wave and Microwave Testing
Our team of experts will be available to answer your questions, provide live demonstrations, and engage in meaningful discussions about your unique testing requirements.
We guarantee a showcase that will leave you inspired and ready to take your testing capabilities to unparalleled heights:
- VNA Broadband Measurements to 220 GHz: Witness a powerful measurement tool for performance analysis of devices ranging from transistors in an on-wafer environment to communication systems.
- Distributed, Modular VNA to 43.6 GHz: Discover the versatility and adaptability of our distributed and modular VNA, designed to conquer the most demanding testing challenges and experience unrivaled performance and flexibility.
- High-Performance Signal Generator: Offering the highest output power and unparalleled signal quality, Rubidium is designed to test the latest aerospace and defense technologies, beyond 5G/6G networks to G-band, and satellite communication systems.
- High-Frequencey Spectral Analysis: Unlock the hidden potential of high-frequency signals, gain invaluable insights, and propel your testing capabilities to new horizons.
- Microelectronics Technology Center: We’re your trusted partner in providing a complete turn-key solution for your thin film device and component assembly needs including groundbreaking research and development for devices.
Learn from our Engineering Experts in Workshops, Keynotes and MicroApp Sessions
| Sun. 6/11 @ 8 - 17:20: Location: 31C - Workshop |
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| Title: | Measurements of Phased Array Beamforming Dynamics and Transients at mm-Wave Frequencies The required steering and settling speeds for many phased array systems are increasingly demanding to support overall data throughput, scanning requirements, and for other reasons. As a result, studies of the beam dynamics become more important at both design and characterization levels. The measurements to perform those studies may need to have acquisition speeds on the ns scale, low-latency-triggering requirements, fast receiver scanning in space and/or frequency and other features. This talk will explore some possible measurement structures at mm-wave frequencies, execution and uncertainty challenges, and a sampling of interesting beam behaviors that can be revealed with enough time and receiver resolution. |
| Author: | Dr. Jon Martens, PhD, Anritsu |
| Mon. 6/12 @ 8 - 17:20: Location: 32AB - Workshop |
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| Title: | Recent Advances in Low Phase Noise and High Stability Microwave Oscillators This workshop will address the timely subject of low-phase-noise and high-stability microwave oscillators which are key building blocks of virtually any RF/microwave system. State-of-the-art low-noise and high-stability microwave oscillators are particularly important in high-speed telecommunications, wireless spectrum management, and high-resolution imaging systems. The overall performance of most microwave subsystems depends on and is often limited by phase noise fluctuations in oscillators. In respect to phase noise and stability performance, designers primarily rely on oversized crystal oscillators. However, recent advances in using other physical principles and materials are expected to enable oscillators with performance never imagined before. Various oscillator types, techniques, new materials, and main characteristics will be reviewed. |
| Organizers: | Alexander Chenakin, Anritsu and Amarpal Paul Khanna, Apionics |
| Tue. 6/13 @ 8:00 - 8:20: Location: 31C - Industry Keynote |
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| Title: | INDUSTRY KEYNOTE: Advances in Microwave Synthesizer Technology The frequency synthesizer is a key building block of virtually any RF/microwave system. It generates a stimulus signal on the transmitter side or is used as a local oscillator in a variety of up- and down-conversion schemes. Signal generators are also one of the fastest-growing segments in the test-and-measurement market with an annual growth rate of about 7%. Demand is driven by wireless communications, aerospace and defense, and automotive industries as well as by new technologies such as 6G. The principal driver behind the 6G technology is the ever-increasing need for more capacity and higher data rates in wireless networks. Due to the heavy use of existing frequency bands, there is a strong interest in using higher frequencies to enable more bandwidth. This is generating interest to move beyond 100 GHz carrier frequencies and to the Terahertz domain. Aside from the frequency coverage, phase noise remains one of the most critical parameters that impose the ultimate limit on the system’s ability to resolve signals of small amplitude. Furthermore, today’s industry demands more complex waveforms to transmit more information over available frequency bands. |
| Author: | Alexander Chenakin, Chief Technology Officer, Anritsu |
| Tue. 6/13 @ 13:15 - 13:30: Location: MicroApps Theater, Booth 2447 |
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| Title: | Broadband On-wafer Differential VNA Measurements to 220 GHz: Concepts and Solutions The advantages of noise immunity and signal optimization in differential circuit design have pushed differential boundaries well into the mmWave region and resulted in a demand for differential on-wafer measurements beyond 145 GHz. This presentation will discuss key equipment parameters of the Anritsu VectorStar ME7838G4 Broadband System and MPI differential probes, that enable true differential measurement up to 220 GHz. A description of important aspects of VectorStar broadband systems such as raw and corrected port parameters and factors that can affect calibration and measurement stability, will be presented. On-wafer measurement concerns to obtain calibration and measurement optimization will also be discussed. |
| Speaker: | Navneet Kataria, Anritsu Product Marketing Manager |
| Wed. 6/14 @ 10:00 - 10:15: Location: MicroApps Theater, Booth 2447 |
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| Title: | 6G Devices, Applications and Related Measurements Challenges In this microapp, various applications for 6G and how the 6G devices are being measured at extremely high frequencies (D, G, and J bands) will be discussed. As the frequencies are going higher and higher and the size of the devices on-wafer are becoming smaller and smaller, making accurate and precise measurements is becoming challenging. The complexity of 6G devices and their designs forces the device modelers to push the limits of today's available instrumentation to make precise measurements. Differential mixers/amplifiers and fundamental device characterization with a broadband 70 KHz to 220 GHz VNA would be discussed in this micro app. |
| Author: | Navneet Kataria, Anritsu Product Marketing Manager |
| Thur. 6/15 @ 10:00 - 10:15: Location: MicroApps Theater, Booth 2447 |
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| Title: | A Paradigm Shift in Distributed Modular VNA Architecture That Makes Long Distance Measurement Simple and Easy In this Microapp presentation, an innovative distributed modular VNA architecture powered by PhaseLync technology will be presented that can dramatically simplify the setup, calibration, and measurement for both total path loss and group delay. Having two ports of the VNA spaced out by a distance greater than 20m/50m and > 100m and still being able to make vector-corrected S parameter measurements opens up solving many issues with the primitive way of making traditional measurements. A competitive analysis will be presented between distributed modular VNA enabled by PhaseLync technology and the traditional benchtop VNA method. |
| Author: | Navneet Kataria, Anritsu Product Marketing Manager |