Industry-Leading, Single-Sweep Frequency Span from 70 kHz to 220 GHz

  • RF/Microwave Test and Component Solutions for New Space1:02:09

    RF/Microwave Test and Component Solutions for New Space

    On-demand Microwave Journal panel discussion: RF/Microwave Test and Component Solutions for New Space

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  • 5G Smart Surface Test Challenge met by ShockLine™ Modular 2-port VNA

    5G Smart Surface Test Challenge met by ShockLine™ Modular 2-port VNA

    Anritsu Custom Solutions team assisted a provider of HMI and Smart Surface solutions in identifying a robust solution for validating the performance of their printed 5G Smart Surfaces.

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  • Making Long Distance Measurements Simple59:49

    Making Long Distance Measurements Simple

    This webinar will review traditional long cable insertion loss test solutions and the limitations and drawbacks of these methods. It will also discuss an innovative distributed modular VNA architectur

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  • Total Harmonic Distortion Measurements

    Total Harmonic Distortion Measurements

    THD is commonly defined as the proportion of the root mean square (RMS) sum of harmonic signal amplitudes related to a desired fundamental frequency.

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  • Material Measurement Solutions – Focusing on 5G  and 6G

    Material Measurement Solutions – Focusing on 5G and 6G

    Material measurement will  become an even more important measurement to be performed on all devices that carry high-frequency signals. Characterizing the materials for their electrical loss properties

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  • Probe-Tip Power Calibrations with the Broadband ME7838 VNA Systems

    Probe-Tip Power Calibrations with the Broadband ME7838 VNA Systems

    This paper discusses methods for transferring the sensor-based calibration to the probe tip using user power calibrations and power embedding/de-embedding for broadband and banded millimeter-wave (mmW

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  • 5G|6G Device Characterization Made Easy1:02:00

    5G|6G Device Characterization Made Easy

    Characterizing high-frequency active or passive devices is extremely challenging especially now that more devices are in the D-band and above which are paving the path for future technologies like 6G

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  • MWRF Webchat Broadband Vector Network Analyzers (VNAs) and their Benefits in Device Characterization22:17

    MWRF Webchat Broadband Vector Network Analyzers (VNAs) and their Benefits in Device Characterization

    Hosted by MW&RF this informative Q&A webchat with Anritsu discusses one of the primary use cases for a broadband VNA – on-wafer, device characterization

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  • Anritsu Presents new Rubidium™ MG362x1A Series at IMS 20222:07

    Anritsu Presents new Rubidium™ MG362x1A Series at IMS 2022

    Rubidium is the lowest phase noise (-140 dBc/Hz at 10 GHz output at 10 kHz offset) signal generator which is better than traditional signal generators currently available on the market

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  • Anritsu and Polar Instrument Solution for Delta-L 4.0 Measurement Based on Atlas SI Software with Anritsu 4-Port Benchtop VNAs

    Anritsu and Polar Instrument Solution for Delta-L 4.0 Measurement Based on Atlas SI Software with Anritsu 4-Port Benchtop VNAs

    Delta-L is an algorithm developed by Intel for PCB manufacturers for verifying PCB design. Vector Network Analyzer serves an important requirement for all PCB manufacturers in order to be compliant

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  • Offline Split 2x-Thru Touchstone File to Two 1x-Thru Using Equation Editor in ShockLine™ Vector Network Analyzer

    Offline Split 2x-Thru Touchstone File to Two 1x-Thru Using Equation Editor in ShockLine™ Vector Network Analyzer

    This application note shows how to extract 2x-thru to 1x-thru using the equation editor feature in offline mode since 2x-thru is the most popular network extraction method for splitting into two (2) 1

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  • Material Measurements with Vector Network Analyzers

    Material Measurements with Vector Network Analyzers

    The increasing popularity of mobile communications, wireless data transfers, and instant access technologies is giving rise to the need for faster data rates and more data channels to support an ever-

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  • VNA Measurement Challenges and Solutions for Evolving Applications

    VNA Measurement Challenges and Solutions for Evolving Applications

    This eBook covers some of the new advancements in VNA technology that are enabling new applications to use VNAs for characterization.

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  • Performance Broadband 220 GHz VNA On-Wafer Measurement - Part 313:10

    Performance Broadband 220 GHz VNA On-Wafer Measurement - Part 3

    This three-part series of the VectorStar ME7838G broadband system will describe how the VectorStar ME7838G can be set up to make on-wafer measurements sweeping from 70 kHz to 220 GHz.

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  • Performing Broadband 220 GHz VNA On-Wafer Meassurements Part 222:55

    Performing Broadband 220 GHz VNA On-Wafer Meassurements Part 2

    Part 2 will continue the discussion with broadband calibration and broadband measurement best practices.

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  • Performing Broadband 220 GHz VNA On-Wafer Measurements - Part 123:08

    Performing Broadband 220 GHz VNA On-Wafer Measurements - Part 1

    Part 1 of the series will discuss the basic broadband structure, module interface technologies, and the broadband 220 GHz probe

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  • Antenna Measurements with a VNA26:53

    Antenna Measurements with a VNA

    As higher frequencies are considered for automotive radar or for 5G communication systems

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  • ShockLine Vector Network Analyzers Automotive Applications Overview6:23

    ShockLine Vector Network Analyzers Automotive Applications Overview

    ShockLine Vector Network Analyzers Automotive Applications Overview Discover how ShockLine VNAs are utilized for testing automotive applications both inside and outside of the vehicle.

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  • ShockLine ME7868A 2-Port VNA System Introduction4:11

    ShockLine ME7868A 2-Port VNA System Introduction

    This video introduces the latest addition to the ShockLine family, ME7868A 2-Port VNA system

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  • IMD Measurement on a 70 GHz VectorStar34:02

    IMD Measurement on a 70 GHz VectorStar

    In this webinar session, you will learn about IMDView™ software that provides the ability to automatically switch between S-parameter measurements and intermodulation characterization using the option

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