Meet our Technical Experts and see live Demonstrations featuring our MP1900A BERT and MS4647B VectorStar VNA in booth 907

Our team of experts will be available to answer your questions, provide live demonstrations, and engage in meaningful discussions about your unique testing requirements.

And don't miss our technical sessions presented in Great America 3 Ballroom:

• Intra-Pair Skew (P/N) Tolerance Test solution presented by Anritsu's Hiroshi Goto. In the high-speed backplane and interconnect, the intra-lane skew of the differential signal (P/N) becomes one of the major factors to reduce the eye margin. Because of the small phase margin of PAM4 signal it has a huge impact to cause the errors in the data transmission. In this session, quantify the intra-lane skew versus BER (Bit Error Rate) at 32Gbaud PAM4 signal (PCIe 6.0) with the repeatable skew control. This presentation shows a novel & reliable method for introducing granular intra-pair skew into the channel and measure the impact of BER. Come by the booth for the live demo of this intra-pair skew

• USB4 Version 2.0, Thunderbolt 5, and DisplayPort 2.1 Physical Layer Compliance and System Debug. Mike Engbretson, Product Marketing Manager, Teledyne LeCroy will present physical layer compliance and system debug testing methods for the latest USB Type-C® (USB4, Thunderbolt, and DisplayPort) technologies. The latest specifications include 40Gbps PAM3 (USB4 Gen4) signaling over up to three lanes and 20Gbps NRZ over up to four lanes of the USB-C cable. Mike will present the latest Tx/Rx physical layer compliance test requirements and the Teledyne LeCroy methods of implementation (MOIs) using the Teledyne LeCroy WaveMaster/SDA 8000HD oscilloscope, WavePulser 40iX Network Analyzer, and Anritsu MP1900A stressed signal generator.

• Advanced de-embedding algorithms in Signal integrity for high-speed Applications, presented by Krishna Kishore Reddy. High speed requirements from datacenters to support AI applications are growing at a very rapid rate. To support high speed data transfer, the datacenters rely on signal integrity and advanced de-embedding algorithms to ensure the data is not only transferred at a very high rate but also with a good BER and good eye openings at the Rx side. This session from Anritsu Company will cover the advanced de-embedding algorithms that are required by the modern age signal integrity applications. The divide by 2 is no longer the only algorithm required, improved performance can be achieved by various other more impactful and fast algorithms. Sometimes the device and non-symmetrical in nature and the divide by 2 algorithm is not a good choice.

• PCI Express 7.0 PHY Electrical Pathfinding Updates, presented by Joey Chiu from Tektronix. With the rapid growth of Artificial Intelligence and Machine Learning applications, the demand for faster interconnect accelerates. Being one of the backbones of high-bandwidth data interconnect, PCI Express continues to evolve, doubling the data rate every three years. The latest PCI Express 7.0 is expected to reach 128 GT/s per lane, which supports close to 512 GB/s of data transfer rate with a full sixteen lanes of bi-directional bandwidth. In this session, we are going to cover the expected PCI Express 7.0 transmitter and receiver tests, the measurement methodologies of several key tests including Signal-to-Noise and Distortion Radio (SNDR), Ratio Level Mismatch (RLM), and uncorrelated jitter; and our pathfinding updates.

• High frequency Opto-electronics and Signal Integrity applications and its relevance in data center/AI applications, from Anritsu's Navneet Kataria. Opto-electronics/Siph/PIC is becoming more and more relevant in this modern age of high-spee applications which are driven by data centers and ultimately finding their place in AI applications. High Speed modulators, high speed photodetectors are now becoming a part of the photonic integrated circuits that can support data rates as high at 1.6T. Opto-electronics combined with Signal integrity forms the core of the measurements required by datacenters. Anritsu’s ME7848A (ONA) and Advanced signal integrity measurement techniques are making the lives of design engineers by providing a one stop solution for all measurements.

  In Partnership with: